Generalized Multiple Dependent State Sampling Plans in Presence of Measurement Data

This article introduces a generalized version of the multiple dependent state sampling plan based on the measurement data, that is, when the quality characteristic is measured in a numerical scale. The conditions of application and the operating procedures of the proposed plan are discussed sequenti...

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Bibliographic Details
Main Authors: Ritwik Bhattacharya, Muhammad Aslam
Format: Article
Language:English
Published: IEEE 2020-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/9186020/