Raw and processed data used in the simultaneous analysis of electrical characteristics and microstructure of crystallised PEDOT:PSS based OECTs under strain

Raw and processed data used in the simultaneous analysis of electrical characteristics and microstructure of crystallised PEDOT:PSS based OECTs under strain

Here is presented raw and analysed data collected during study of the evolution, with uniaxial stretching, of the electrical and microcrystalline characteristics of polystyrene sulfonate doped poly(3,4-ethylenedioxythiophene) (PEDOT:PSS) organic electrochemical transistors (OECTs). X-ray diffraction...

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Bibliographic Details
Main Authors: J.G. Troughton, B. Marchiori, R. Delattre, S. Escoubas, MY. Aliouat, S. Grigorian, M. Ramuz
Format: Article
Language:English
Published: Elsevier 2021-04-01
Series:Data in Brief
Subjects:
PEDOT:PSS
OECT
GIWASX
Correlating microstructure and performance
SOLEIL
Synchrotron
Online Access:http://www.sciencedirect.com/science/article/pii/S2352340921002304

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http://www.sciencedirect.com/science/article/pii/S2352340921002304

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