Secondary Ion Emission during the Proton Bombardment of Metal Surfaces
Secondary ion mass spectrometry (SIMS) is successfully used for fundamental and applied studies of the solid surfaces. Thus, it is important to know regularities in the secondary ion emission (SIE) induced by the primary beams of the inert or chemically active elements. The SIE intensity is found to...
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| Format: | Article |
| Language: | English |
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G. V. Kurdyumov Institute for Metal Physics of the N.A.S. of Ukraine
2018-03-01
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| Series: | Успехи физики металлов |
| Online Access: | https://doi.org/10.15407/ufm.19.01.049 |