A Discrete Detection and Decoding of MLC NAND Flash Memory With Retention Noise

The retention noise in MLC NAND flash memory has a great impact on reliability and lifetime of devices. How to recover information from the data corrupted by retention noise is a challenging problem. The joint processing of channel estimation, detection and low-density parity-check (LDPC) decoding i...

Full description

Bibliographic Details
Main Authors: Wenhao Sun, Jianping Zheng
Format: Article
Language:English
Published: IEEE 2020-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/9047879/