A reliability model for a wafer FAB
Proposed in this paper is a new reliability model for a wafer fabrication plant (FAB). The reliability prediction of a FAB is essential for various activities; feasibility evaluation, comparing competing designs, identifying potential reliability problems, planning maintenance and logistic support s...
Main Authors: | Joong S. Jang, Sang C. Park |
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Format: | Article |
Language: | English |
Published: |
Taylor & Francis Group
2017-01-01
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Series: | Cogent Engineering |
Subjects: | |
Online Access: | http://dx.doi.org/10.1080/23311916.2017.1340817 |
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