NBTI-Aware Transient Fault Rate Analysis Method for Logic Circuit Based on Probability Voltage Transfer Characteristics

NBTI-Aware Transient Fault Rate Analysis Method for Logic Circuit Based on Probability Voltage Transfer Characteristics

The reliability of Very Large Scale Integration (VLSI) circuits has become increasingly susceptible to transient faults induced by environmental noise with the scaling of technology. Some commonly used fault tolerance strategies require statistical methods to accurately estimate the fault rate in di...

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Bibliographic Details
Main Authors: Zhiming Yang, Junbao Li, Yang Yu, Xiyuan Peng
Format: Article
Language:English
Published: MDPI AG 2016-01-01
Series:Algorithms
Subjects:
VLSI circuit
transient fault
aging effects
voltage transfer characteristics
discrete probability density function approximation
Online Access:http://www.mdpi.com/1999-4893/9/1/9

Internet

http://www.mdpi.com/1999-4893/9/1/9

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