Strain-relaxation and critical thickness of epitaxial La1.85Sr0.15CuO4 films

We report the thickness-dependent strain-relaxation behavior and the associated impacts upon the superconductivity in epitaxial La1.85Sr0.15CuO4 films grown on different substrates, which provide a range of strain. We have found that the critical thickness for the onset of superconductivity in La1.8...

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Bibliographic Details
Main Authors: T. L. Meyer, L. Jiang, S. Park, T. Egami, H. N. Lee
Format: Article
Language:English
Published: AIP Publishing LLC 2015-12-01
Series:APL Materials
Online Access:http://dx.doi.org/10.1063/1.4937170