X-ray Assisted Scanning Tunneling Microscopy and Its Applications for Materials Science: The First Results on Cu Doped ZrTe<sub>3</sub>

X-ray Assisted Scanning Tunneling Microscopy and Its Applications for Materials Science: The First Results on Cu Doped ZrTe<sub>3</sub>

Synchrotron X-ray Scanning Tunneling Microscopy (SX-STM) is a novel imaging technique capable of providing real space chemically specific mapping with a potential of reaching atomic resolution. Determination of chemical composition along with ultra-high resolution imaging by SX-STM can be realized t...

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Bibliographic Details
Main Authors: Hui Yan, Nozomi Shirato, Xiangde Zhu, Daniel Rosenmann, Xiao Tong, Weihe Xu, Cedomir Petrovic, Volker Rose, Evgeny Nazaretski
Format: Article
Language:English
Published: MDPI AG 2019-11-01
Series:Crystals
Subjects:
sx-stm
scanning microscopy
synchrotron
smart tips
elemental mapping
Online Access:https://www.mdpi.com/2073-4352/9/11/588

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https://www.mdpi.com/2073-4352/9/11/588

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