Throughput and resolution with a next-generation direct electron detector

Throughput and resolution with a next-generation direct electron detector

Direct electron detectors (DEDs) have revolutionized cryo-electron microscopy (cryo-EM) by facilitating the correction of beam-induced motion and radiation damage, and also by providing high-resolution image capture. A new-generation DED, the DE64, has been developed by Direct Electron that has good...

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Bibliographic Details
Main Authors: Joshua H. Mendez, Atousa Mehrani, Peter Randolph, Scott Stagg
Format: Article
Language:English
Published: International Union of Crystallography 2019-11-01
Series:IUCrJ
Subjects:
3d reconstruction
image processing
advances in microscope hardware
single-particle cryo-em
direct electron detectors
Online Access:http://scripts.iucr.org/cgi-bin/paper?S2052252519012661

Internet

http://scripts.iucr.org/cgi-bin/paper?S2052252519012661

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