Automatic Fault Detection Circuit for Integrated Gate Drivers of Active-Matrix Displays

Automatic Fault Detection Circuit for Integrated Gate Drivers of Active-Matrix Displays

This paper presents automatic fault detection circuit for integrated gate drivers. The proposed circuit consists of one capacitor and two TFTs per scan line. The circuit can detect three types of faults, such as line disconnection (LD), low voltage stuck (LVS), and high voltage stuck (HVS) for the g...

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Bibliographic Details
Main Authors: Byung-Chang Yu, Jongbin Kim, Seung-Hyuck Lee, Hoon-Ju Chung, Seung-Woo Lee
Format: Article
Language:English
Published: IEEE 2019-01-01
Series:IEEE Journal of the Electron Devices Society
Subjects:
Fault detection
stretchable display
gate driver circuits
Online Access:https://ieeexplore.ieee.org/document/8567987/

Internet

https://ieeexplore.ieee.org/document/8567987/

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