Charge erasure analysis on the nanoscale using Kelvin probe force microscopy
The charge pattern produced by atomic force microscopy on an insulating surface can be detected on the nanoscale using Kelvin probe force microscopy. Recent applications of charge patterns include data storage, nano-xerography, and charge writing. At present, ongoing development of this technology i...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2017-07-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/1.4989568 |