Mechanical Deformation Behavior of Nonpolar GaN Thick Films by Berkovich Nanoindentation

Mechanical Deformation Behavior of Nonpolar GaN Thick Films by Berkovich Nanoindentation

<p>Abstract</p> <p>In this study, the deformation mechanisms of nonpolar GaN thick films grown on m-sapphire by hydride vapor phase epitaxy (HVPE) are investigated using nanoindentation with a Berkovich indenter, cathodoluminescence (CL), and Raman microscopy. Results show that non...

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Bibliographic Details
Main Authors: Yang Yang, Liu Yulong, Wei Tongbo, Hu Qiang, Duan Ruifei, Wang Junxi, Zeng Yiping, Li Jinmin
Format: Article
Language:English
Published: SpringerOpen 2009-01-01
Series:Nanoscale Research Letters
Subjects:
GaN
Nonpolar
HVPE
Nanoindentation
Cathodoluminescence
Raman mapping
Online Access:http://dx.doi.org/10.1007/s11671-009-9310-1

Internet

http://dx.doi.org/10.1007/s11671-009-9310-1

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