TRIC: A Thermal Resistance and Impedance Calculator for Electronic Packages

This paper presents the Thermal Resistance and Impedance Calculator (TRIC) tool devised for the automatic extraction of thermal metrics of package families of electronic components in both static and transient conditions. TRIC relies on a solution algorithm based on a novel projection-based approach...

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Main Authors: Lorenzo Codecasa, Francesca De Viti, Vincenzo d’Alessandro, Donata Gualandris, Arianna Morelli, Claudio Maria Villa
Format: Article
Language:English
Published: MDPI AG 2020-05-01
Series:Energies
Subjects:
Online Access:https://www.mdpi.com/1996-1073/13/9/2252
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spelling doaj-8af5e5c1020241d7a55991a25e4f575c2020-11-25T02:54:37ZengMDPI AGEnergies1996-10732020-05-01132252225210.3390/en13092252TRIC: A Thermal Resistance and Impedance Calculator for Electronic PackagesLorenzo Codecasa0Francesca De Viti1Vincenzo d’Alessandro2Donata Gualandris3Arianna Morelli4Claudio Maria Villa5Department of Electronics, Information and Bioengineering, Politecnico di Milano, 20133 Milan, ItalySTMicroelectronics, 20864 Agrate Brianza, ItalyDepartment of Electrical Engineering and Information Technology, University Federico II, 80125 Naples, ItalySTMicroelectronics, 20864 Agrate Brianza, ItalySTMicroelectronics, 20864 Agrate Brianza, ItalySTMicroelectronics, 20864 Agrate Brianza, ItalyThis paper presents the Thermal Resistance and Impedance Calculator (TRIC) tool devised for the automatic extraction of thermal metrics of package families of electronic components in both static and transient conditions. TRIC relies on a solution algorithm based on a novel projection-based approach, which—unlike previous techniques—allows (i) dealing with parametric detailed thermal models (pDTMs) of package families that exhibit generic non-Manhattan variations of geometries and meshes, and (ii) transforming such pDTMs into compact thermal models that can be solved in short times. Thermal models of several package families are available, and dies with multiple active areas can be handled. It is shown that transient thermal responses of chosen packages can be obtained in a CPU (central processing unit) time much shorter than that required by a widely used software relying on the finite-volume method without sacrificing accuracy.https://www.mdpi.com/1996-1073/13/9/2252electronic packagesdetailed thermal modelJoint Electron Device Engineering Council (JEDEC) metricsthermal impedancethermal simulation
collection DOAJ
language English
format Article
sources DOAJ
author Lorenzo Codecasa
Francesca De Viti
Vincenzo d’Alessandro
Donata Gualandris
Arianna Morelli
Claudio Maria Villa
spellingShingle Lorenzo Codecasa
Francesca De Viti
Vincenzo d’Alessandro
Donata Gualandris
Arianna Morelli
Claudio Maria Villa
TRIC: A Thermal Resistance and Impedance Calculator for Electronic Packages
Energies
electronic packages
detailed thermal model
Joint Electron Device Engineering Council (JEDEC) metrics
thermal impedance
thermal simulation
author_facet Lorenzo Codecasa
Francesca De Viti
Vincenzo d’Alessandro
Donata Gualandris
Arianna Morelli
Claudio Maria Villa
author_sort Lorenzo Codecasa
title TRIC: A Thermal Resistance and Impedance Calculator for Electronic Packages
title_short TRIC: A Thermal Resistance and Impedance Calculator for Electronic Packages
title_full TRIC: A Thermal Resistance and Impedance Calculator for Electronic Packages
title_fullStr TRIC: A Thermal Resistance and Impedance Calculator for Electronic Packages
title_full_unstemmed TRIC: A Thermal Resistance and Impedance Calculator for Electronic Packages
title_sort tric: a thermal resistance and impedance calculator for electronic packages
publisher MDPI AG
series Energies
issn 1996-1073
publishDate 2020-05-01
description This paper presents the Thermal Resistance and Impedance Calculator (TRIC) tool devised for the automatic extraction of thermal metrics of package families of electronic components in both static and transient conditions. TRIC relies on a solution algorithm based on a novel projection-based approach, which—unlike previous techniques—allows (i) dealing with parametric detailed thermal models (pDTMs) of package families that exhibit generic non-Manhattan variations of geometries and meshes, and (ii) transforming such pDTMs into compact thermal models that can be solved in short times. Thermal models of several package families are available, and dies with multiple active areas can be handled. It is shown that transient thermal responses of chosen packages can be obtained in a CPU (central processing unit) time much shorter than that required by a widely used software relying on the finite-volume method without sacrificing accuracy.
topic electronic packages
detailed thermal model
Joint Electron Device Engineering Council (JEDEC) metrics
thermal impedance
thermal simulation
url https://www.mdpi.com/1996-1073/13/9/2252
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