Photoluminescent method for studying the plastic deformation at the boudary of «SiO2—Si»

Photoluminescent method for studying the plastic deformation at the boudary of «SiO2—Si»

The possibility of using the photoluminescence method for studying the mechanisms of plastic deformation at the boundary of "SiO2—Si" in the process of obtaining nanostructured silicon layers by deformation.

Bibliographic Details
Main Authors: Kulinich O. A., Yatsunskiy I. P., Eshtokina T. Yu., Brusenskaya G. I., Marchuk I. A.
Format: Article
Language:English
Published: Politehperiodika 2012-04-01
Series:Tekhnologiya i Konstruirovanie v Elektronnoi Apparature
Subjects:
photoluminescence
flowage
defects
dislocations
tensions
Online Access:http://www.tkea.com.ua/tkea/2012/2_2012/pdf/10.zip
id doaj-89eddc329e874c3b96d6ff10ad45e7a0
record_format Article
spelling doaj-89eddc329e874c3b96d6ff10ad45e7a02020-11-24T23:34:53ZengPolitehperiodikaTekhnologiya i Konstruirovanie v Elektronnoi Apparature2225-58182012-04-0124750Photoluminescent method for studying the plastic deformation at the boudary of «SiO2—Si»Kulinich O. A.Yatsunskiy I. P.Eshtokina T. Yu.Brusenskaya G. I.Marchuk I. A.The possibility of using the photoluminescence method for studying the mechanisms of plastic deformation at the boundary of "SiO2—Si" in the process of obtaining nanostructured silicon layers by deformation.http://www.tkea.com.ua/tkea/2012/2_2012/pdf/10.zipphotoluminescenceflowagedefectsdislocationstensions
collection DOAJ
language English
format Article
sources DOAJ
author Kulinich O. A.
Yatsunskiy I. P.
Eshtokina T. Yu.
Brusenskaya G. I.
Marchuk I. A.
spellingShingle Kulinich O. A.
Yatsunskiy I. P.
Eshtokina T. Yu.
Brusenskaya G. I.
Marchuk I. A.
Photoluminescent method for studying the plastic deformation at the boudary of «SiO2—Si»
Tekhnologiya i Konstruirovanie v Elektronnoi Apparature
photoluminescence
flowage
defects
dislocations
tensions
author_facet Kulinich O. A.
Yatsunskiy I. P.
Eshtokina T. Yu.
Brusenskaya G. I.
Marchuk I. A.
author_sort Kulinich O. A.
title Photoluminescent method for studying the plastic deformation at the boudary of «SiO2—Si»
title_short Photoluminescent method for studying the plastic deformation at the boudary of «SiO2—Si»
title_full Photoluminescent method for studying the plastic deformation at the boudary of «SiO2—Si»
title_fullStr Photoluminescent method for studying the plastic deformation at the boudary of «SiO2—Si»
title_full_unstemmed Photoluminescent method for studying the plastic deformation at the boudary of «SiO2—Si»
title_sort photoluminescent method for studying the plastic deformation at the boudary of «sio2—si»
publisher Politehperiodika
series Tekhnologiya i Konstruirovanie v Elektronnoi Apparature
issn 2225-5818
publishDate 2012-04-01
description The possibility of using the photoluminescence method for studying the mechanisms of plastic deformation at the boundary of "SiO2—Si" in the process of obtaining nanostructured silicon layers by deformation.
topic photoluminescence
flowage
defects
dislocations
tensions
url http://www.tkea.com.ua/tkea/2012/2_2012/pdf/10.zip
work_keys_str_mv AT kulinichoa photoluminescentmethodforstudyingtheplasticdeformationattheboudaryofsio2si
AT yatsunskiyip photoluminescentmethodforstudyingtheplasticdeformationattheboudaryofsio2si
AT eshtokinatyu photoluminescentmethodforstudyingtheplasticdeformationattheboudaryofsio2si
AT brusenskayagi photoluminescentmethodforstudyingtheplasticdeformationattheboudaryofsio2si
AT marchukia photoluminescentmethodforstudyingtheplasticdeformationattheboudaryofsio2si
_version_ 1725527198899634176

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