Fitting of Atomic Force Microscopy Force Curves with a Sparse Representation Model
Atomic force microscopy (AFM) is a high-resolution scanning technology, and the measured data are a set of force curves, which can be fitted with a piecewise curve model and be analyzed further. Most methods usually follow a two-step strategy: first, the discontinuities (or breakpoints) are detected...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Hindawi Limited
2021-01-01
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| Series: | Mathematical Problems in Engineering |
| Online Access: | http://dx.doi.org/10.1155/2021/1951456 |