Detection of a Conductive Object Embedded in an Optically Opaque Dielectric Medium by the Thermo-Elastic Optical Indicator Microscopy
We present a new method for the subsurface imaging of a conductive object embedded in a dielectric medium based on microwave imaging by thermo-elastic optical indicator microscopy. The present method is based on the imaging of the microwave near field distribution generated by a conductive object em...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2019-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/8680619/ |