Optical Control System for Displacement Monitoring of the High Precision Measurement Setup Elements

Introduction. When operating high-precision measurement setups, the reliability of measurements needs to be guaranteed. The displacement of elements from the measurement path can lead to a distortion of measurement results, especially in measurement setups operating in the microwave range. In order...

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Bibliographic Details
Main Authors: Victor V. Kholkin, Vladimir Yu. Kholkin
Format: Article
Language:Russian
Published: Saint Petersburg Electrotechnical University "LETI" 2019-10-01
Series:Известия высших учебных заведений России: Радиоэлектроника
Subjects:
Online Access:https://re.eltech.ru/jour/article/view/358