Write Termination Circuits for RRAM: A Holistic Approach From Technology to Application Considerations

Write Termination Circuits for RRAM: A Holistic Approach From Technology to Application Considerations

While Resistive Random Access Memories (RRAM) are perceived nowadays as a promising solution for the future of computing, these technologies suffer from intrinsic variability regarding programming voltage, switching speed and achieved resistance values. Write Termination (WT) circuits are a potentia...

Full description

Bibliographic Details
Main Authors: Alexandre Levisse, Marc Bocquet, Marco Rios, Mouhamad Alayan, Mathieu Moreau, Etienne Nowak, Gabriel Molas, Elisa Vianello, David Atienza, Jean-Michel Portal
Format: Article
Language:English
Published: IEEE 2020-01-01
Series:IEEE Access
Subjects:
RRAM
embedded memories
write termination
memory modeling
low-power design
Online Access:https://ieeexplore.ieee.org/document/9110858/

Internet

https://ieeexplore.ieee.org/document/9110858/

Similar Items