FEI Titan 80-300 TEM
The FEI Titan 80-300 TEM is a high-resolution transmission electron microscope equipped with a field emission gun and a corrector for the spherical aberration (CS) of the imaging lens system. The instrument is designed for the investigation of a wide range of solid state phenomena taking place on th...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
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Forschungszentrum Jülich
2016-01-01
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| Series: | Journal of large-scale research facilities JLSRF |
| Online Access: | http://jlsrf.org/index.php/lsf/article/view/66 |
| Summary: | The FEI Titan 80-300 TEM is a high-resolution transmission electron microscope equipped with a field emission gun and a corrector for the spherical aberration (CS) of the imaging lens system. The instrument is designed for the investigation of a wide range of solid state phenomena taking place on the atomic scale, which requires true atomic resolution capabilities. Under optimum optical settings of the image CS-corrector (CEOS CETCOR) the point-resolution is extended up to the information limit of well below 100 pm with 200 keV and 300 keV electrons. A special piezo-stage design allows ultra-precise positioning of the specimen in all 3 dimensions. Digital images are acquired with a Gatan 2k x 2k slow-scan charged coupled device camera. |
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| ISSN: | 2364-091X |