FEI Titan 80-300 TEM
The FEI Titan 80-300 TEM is a high-resolution transmission electron microscope equipped with a field emission gun and a corrector for the spherical aberration (CS) of the imaging lens system. The instrument is designed for the investigation of a wide range of solid state phenomena taking place on th...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
Forschungszentrum Jülich
2016-01-01
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| Series: | Journal of large-scale research facilities JLSRF |
| Online Access: | http://jlsrf.org/index.php/lsf/article/view/66 |