Simultaneous imaging of the ferromagnetic and ferroelectric structure in multiferroic heterostructures
By measuring the spin polarization of secondary electrons and the intensity of backscattered electrons generated in a scanning electron microscope, we are able to simultaneously image the ferromagnetic domain structure of a ferromagnetic thin film and the ferroelectric domain structure of the underl...
| Main Authors: | , , , , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2014-07-01
|
| Series: | APL Materials |
| Online Access: | http://dx.doi.org/10.1063/1.4890055 |