Material property analytical relations for the case of an AFM probe tapping a viscoelastic surface containing multiple characteristic times

We explore the contact problem of a flat-end indenter penetrating intermittently a generalized viscoelastic surface, containing multiple characteristic times. This problem is especially relevant for nanoprobing of viscoelastic surfaces with the highly popular tapping-mode AFM imaging technique. By f...

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Bibliographic Details
Main Authors: Enrique A. López-Guerra, Santiago D. Solares
Format: Article
Language:English
Published: Beilstein-Institut 2017-10-01
Series:Beilstein Journal of Nanotechnology
Subjects:
Online Access:https://doi.org/10.3762/bjnano.8.223