Dual-comb spectroscopic ellipsometry
Spectroscopic ellipsometry is an established technique to characterize the optical properties of a material. Here, Minamikawa et al. combine the method with dual-comb spectroscopy, which allows them to obtain ellipsometric parameters including the phase difference between s-polarized and p-polarized...
Main Authors: | , , , , , , , , , , |
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Format: | Article |
Language: | English |
Published: |
Nature Publishing Group
2017-09-01
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Series: | Nature Communications |
Online Access: | https://doi.org/10.1038/s41467-017-00709-y |