An Extended Multilayer Thermal Model for Multichip IGBT Modules Considering Thermal Aging
An accurate and real-time knowledge of temperatures in insulated-gate bipolar transistor modules is crucial for reliability analysis and thermal management of power electronic converters. For this purpose, this paper establishes an integrated thermal equivalent circuit model comprising self-heating...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2021-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9439476/ |