Failure Analysis of Diode Components of Electronic Relay Packages Via Thorough Microstructural Characterization
Diode components used in the electronic relay packages of avionics of a weapon system had been found corroded. Two sets of the complete assembly of the damaged diode parts consisting of diode body, plain washer, spring washer and mounting nuts were analysed for finding out the root causes of failur...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Deer Hill Publications
2019-09-01
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| Series: | International Journal of Engineering Materials and Manufacture |
| Online Access: | http://www.deerhillpublishing.com/index.php/ijemm/article/view/90 |