Microscopic Machine Vision Based Degradation Monitoring of Low-Voltage Electromagnetic Coil Insulation Using Ensemble Learning in a Membrane Computing Framework

Microscopic Machine Vision Based Degradation Monitoring of Low-Voltage Electromagnetic Coil Insulation Using Ensemble Learning in a Membrane Computing Framework

In this paper, a novel microscopic machine vision system is proposed to solve a degradation monitoring problem of low-voltage electromagnetic coil insulation in practical industrial fields, where an ensemble learning approach in a compound membrane computing framework is newly introduced. This membr...

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Bibliographic Details
Main Authors: Chen Li, Fanjie Kong, Kai Wang, Aidong Xu, Gexiang Zhang, Ning Xu, Zhihua Liu, Haifeng Guo, Xue Wang, Kuan Liang, Jianying Yuan, Shouliang Qi, Tao Jiang
Format: Article
Language:English
Published: IEEE 2019-01-01
Series:IEEE Access
Subjects:
Low-voltage electromagnetic coil
insulation degradation monitoring
ensemble learning
machine vision
membrane computing
microscopic image analysis
Online Access:https://ieeexplore.ieee.org/document/8759861/

Internet

https://ieeexplore.ieee.org/document/8759861/

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