Control Chart Patterns Recognition Based on Optimized Deep Belief Neural Network and Data Information Enhancement
Control chart patterns (CCPs) are often used for quality control in the manufacturing process, and effective recognition of these patterns is critical to manufacturing. In the dynamic production process, the raw data and features of CCPs are used to recognize or further predict the trends. However,...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2020-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9248993/ |