Análisis microestructural comparativo (difracción de rayos X y FESEM) en sepiolita

Análisis microestructural comparativo (difracción de rayos X y FESEM) en sepiolita

Microstructural size characteristics of a reference sepiolite during grinding in a vibratory cup mill have been studied through X-ray diffraction (XRD) line broadening analysis, with Warren- Averbach and Voigt function method in different diffraction directions and through field emission electron mi...

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Bibliographic Details
Main Authors: Bastida, J., Pardo, P., Kojdecki, M., Ramo, P.
Format: Article
Language:English
Published: Elsevier 2006-10-01
Series:Boletín de la Sociedad Española de Cerámica y Vidrio
Subjects:
Microstructure
X Ray Diffraction
crystallite size
FESEM
sepiolite
Microestructura
difracción de rayos X
tamaño de cristalito
sepiolita
Online Access:http://ceramicayvidrio.revistas.csic.es/index.php/ceramicayvidrio/article/view/273/291

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http://ceramicayvidrio.revistas.csic.es/index.php/ceramicayvidrio/article/view/273/291

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