Grain Scale Representative Volume Element Simulation to Investigate the Effect of Crystal Orientation on Void Growth in Single and Multi-Crystals
Crystal plasticity finite element (CPFE) simulations were performed on the representative volume elements (RVE) modeling body centered cubic (bcc) single, bi- and tri-crystals. The RVE model was designed to include a void inside a grain, at a grain boundary and at a triple junction. The effect of si...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2018-06-01
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| Series: | Metals |
| Subjects: | |
| Online Access: | http://www.mdpi.com/2075-4701/8/6/436 |