Comparative Analysis of Ultra-Low Current Measurement Topologies With Implementation in 130 nm Technology

Radiation detectors need front-end electronics capable of measuring currents over a large dynamic range with femtoampere sensitivity. The goal of this work is to find an alternative to the legacy systems implemented using discrete components or technology nodes of 350 nm or higher. The 130 nm techno...

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Bibliographic Details
Main Authors: Sarath Kundumattathil Mohanan, Hamza Boukabache, Daniel Perrin, Ullrich R. Pfeiffer
Format: Article
Language:English
Published: IEEE 2021-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/9409046/