High Performance Seesaw Torsional CMOS-MEMS Relay Using Tungsten VIA Layer
In this paper, a seesaw torsional relay monolithically integrated in a standard 0.35 μm complementary metal oxide semiconductor (CMOS) technology is presented. The seesaw relay is fabricated using the Back-End-Of-Line (BEOL) layers available, specifically using the tungsten VIA3 layer of a...
Main Authors: | , , , |
---|---|
Format: | Article |
Language: | English |
Published: |
MDPI AG
2018-11-01
|
Series: | Micromachines |
Subjects: | |
Online Access: | https://www.mdpi.com/2072-666X/9/11/579 |
id |
doaj-7a218878b7564d1b90c9853ffd502a92 |
---|---|
record_format |
Article |
spelling |
doaj-7a218878b7564d1b90c9853ffd502a922020-11-24T21:47:28ZengMDPI AGMicromachines2072-666X2018-11-0191157910.3390/mi9110579mi9110579High Performance Seesaw Torsional CMOS-MEMS Relay Using Tungsten VIA LayerMartín Riverola0Francesc Torres1Arantxa Uranga2Núria Barniol3Department of Electronics Engineering, Universitat Autònoma de Barcelona, 08193 Bellaterra, SpainDepartment of Electronics Engineering, Universitat Autònoma de Barcelona, 08193 Bellaterra, SpainDepartment of Electronics Engineering, Universitat Autònoma de Barcelona, 08193 Bellaterra, SpainDepartment of Electronics Engineering, Universitat Autònoma de Barcelona, 08193 Bellaterra, SpainIn this paper, a seesaw torsional relay monolithically integrated in a standard 0.35 μm complementary metal oxide semiconductor (CMOS) technology is presented. The seesaw relay is fabricated using the Back-End-Of-Line (BEOL) layers available, specifically using the tungsten VIA3 layer of a 0.35 μm CMOS technology. Three different contact materials are studied to discriminate which is the most adequate as a mechanical relay. The robustness of the relay is proved, and its main characteristics as a relay for the three different contact interfaces are provided. The seesaw relay is capable of a double hysteretic switching cycle, providing compactness for mechanical logic processing. The low contact resistance achieved with the TiN/W mechanical contact with high cycling life time is competitive in comparison with the state-of-the art.https://www.mdpi.com/2072-666X/9/11/579MEMS relaysMEMS switchesmechanical relaysCMOS-MEMSMEMS |
collection |
DOAJ |
language |
English |
format |
Article |
sources |
DOAJ |
author |
Martín Riverola Francesc Torres Arantxa Uranga Núria Barniol |
spellingShingle |
Martín Riverola Francesc Torres Arantxa Uranga Núria Barniol High Performance Seesaw Torsional CMOS-MEMS Relay Using Tungsten VIA Layer Micromachines MEMS relays MEMS switches mechanical relays CMOS-MEMS MEMS |
author_facet |
Martín Riverola Francesc Torres Arantxa Uranga Núria Barniol |
author_sort |
Martín Riverola |
title |
High Performance Seesaw Torsional CMOS-MEMS Relay Using Tungsten VIA Layer |
title_short |
High Performance Seesaw Torsional CMOS-MEMS Relay Using Tungsten VIA Layer |
title_full |
High Performance Seesaw Torsional CMOS-MEMS Relay Using Tungsten VIA Layer |
title_fullStr |
High Performance Seesaw Torsional CMOS-MEMS Relay Using Tungsten VIA Layer |
title_full_unstemmed |
High Performance Seesaw Torsional CMOS-MEMS Relay Using Tungsten VIA Layer |
title_sort |
high performance seesaw torsional cmos-mems relay using tungsten via layer |
publisher |
MDPI AG |
series |
Micromachines |
issn |
2072-666X |
publishDate |
2018-11-01 |
description |
In this paper, a seesaw torsional relay monolithically integrated in a standard 0.35 μm complementary metal oxide semiconductor (CMOS) technology is presented. The seesaw relay is fabricated using the Back-End-Of-Line (BEOL) layers available, specifically using the tungsten VIA3 layer of a 0.35 μm CMOS technology. Three different contact materials are studied to discriminate which is the most adequate as a mechanical relay. The robustness of the relay is proved, and its main characteristics as a relay for the three different contact interfaces are provided. The seesaw relay is capable of a double hysteretic switching cycle, providing compactness for mechanical logic processing. The low contact resistance achieved with the TiN/W mechanical contact with high cycling life time is competitive in comparison with the state-of-the art. |
topic |
MEMS relays MEMS switches mechanical relays CMOS-MEMS MEMS |
url |
https://www.mdpi.com/2072-666X/9/11/579 |
work_keys_str_mv |
AT martinriverola highperformanceseesawtorsionalcmosmemsrelayusingtungstenvialayer AT francesctorres highperformanceseesawtorsionalcmosmemsrelayusingtungstenvialayer AT arantxauranga highperformanceseesawtorsionalcmosmemsrelayusingtungstenvialayer AT nuriabarniol highperformanceseesawtorsionalcmosmemsrelayusingtungstenvialayer |
_version_ |
1725896699247853568 |