A Fault Diagnosis Scheme and Its Quality Issue in Reconfigurable Array Architecture

In this paper, we propose an efficient diagnosis scheme to detect and locate the switching network defects/faults in reconfigurable array architecture. This diagnosis scheme performs the test of switching network based on the scan path and fault intersection test methodology to locate the faults occ...

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Bibliographic Details
Main Author: Yung-Yuan Chen
Format: Article
Language:English
Published: Postgraduate Office, School of Computer Science, Universidad Nacional de La Plata 2006-04-01
Series:Journal of Computer Science and Technology
Subjects:
Online Access:https://journal.info.unlp.edu.ar/JCST/article/view/822