Quantitative microwave impedance microscopy with effective medium approximations
Microwave impedance microscopy (MIM) is a scanning probe technique to measure local changes in tip-sample admittance. The imaginary part of the reported change is calibrated with finite element simulations and physical measurements of a standard capacitive sample, and thereafter the output ΔY is giv...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2017-02-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/1.4976729 |