Photo-induced strain imaging of semiconductors
This paper presents a novel method for high-resolutions imaging of band-gap energies of semiconductors. When electron-hole pairs are generated in a semiconductor irradiated with a laser, they induce electronic strains in the semiconductor. The electronic strains can be detected and imaged by a scann...
| Main Authors: | , , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2017-04-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/1.4979922 |