Ellipsometric measurement of thickness of tin oxides grown by voltammetry in phosphate solution of pH 8.7
The voltammetry induced growth of tin oxides on tin in the buffer solution of 0.18 mol L-1 Na2H2PO4 and 0.18 mol L-1 KH2PO4 (pH 8.7) has been studied. Ex-situ ellipsometric measurements were made in an order to determine thicknesses of the grown oxides. From these results the film volume per charge...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
International Association of Physical Chemists (IAPC)
2016-12-01
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| Series: | Journal of Electrochemical Science and Engineering |
| Subjects: | |
| Online Access: | http://pub.iapchem.org/ojs/index.php/JESE/article/view/326 |