HIDEX: A new high resolution x-ray spectrometer for detailed line profile measurements

• Main Authors: Galtier E., Renner O., Krouský E., Rosmej F.
• Format: Article
• Language: English
• Published: EDP Sciences 2013-11-01
• Series: EPJ Web of Conferences
• Online Access: http://dx.doi.org/10.1051/epjconf/20135913002

We present preliminary obtained with a new spectrometer based on the Johann configuration of cylindrically bent crystals, the HIDEX. The aim of this instrument is to provide detailed line shape and shift measurements of transitions originating from high intensity laser/matter interaction, especially when matter is in extreme conditions of temperature and density. The HIDEX provides two new features. First, its alignment procedure has been improved being now based on an accurate motorized rotation stage that provides a robust and fast way to position the main components in the desired geometrical configuration. Second, there is the option to mount a Charge Coupled Device (CCD) as detector, allowing the instrument to be operated in high repetition rate laser facilities where opening the chamber migh be a critical issue. Here, we report about the test of the prototype at PALS kilo-joule laser facility, Prague, that demonstrated the new alignment procedure concept. First results are discussed.