HIDEX: A new high resolution x-ray spectrometer for detailed line profile measurements
We present preliminary obtained with a new spectrometer based on the Johann configuration of cylindrically bent crystals, the HIDEX. The aim of this instrument is to provide detailed line shape and shift measurements of transitions originating from high intensity laser/matter interaction, especially...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
EDP Sciences
2013-11-01
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| Series: | EPJ Web of Conferences |
| Online Access: | http://dx.doi.org/10.1051/epjconf/20135913002 |