Quality-Driven Kernel Projection to Latent Structure Model for Nonlinear Process Monitoring
A novel quality-driven kernel projection to latent structure (QKPLS) modeling scheme is proposed for concurrent quality-related and process-fault detection for nonlinear processes. Process data are initially mapped into a high-dimensional feature space by nonlinear mapping. The mapped data in the fe...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2019-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/8727979/ |