Reversible mechano-electrochemical writing of metallic nanostructures with the tip of an atomic force microscope

Reversible mechano-electrochemical writing of metallic nanostructures with the tip of an atomic force microscope

We recently introduced a method that allows the controlled deposition of nanoscale metallic patterns at defined locations using the tip of an atomic force microscope (AFM) as a “mechano-electrochemical pen”, locally activating a passivated substrate surface for site-selective electrochemical deposit...

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Bibliographic Details
Main Authors: Christian Obermair, Marina Kress, Andreas Wagner, Thomas Schimmel
Format: Article
Language:English
Published: Beilstein-Institut 2012-12-01
Series:Beilstein Journal of Nanotechnology
Subjects:
atomic force microscopy
electrochemical deposition
electrochemistry
nanoelectronics
nanofabrication
nanolithography
nanotechnology
MEMS and NEMS
reversible processes
scanning probe microscopy and lithography
Online Access:https://doi.org/10.3762/bjnano.3.92

Internet

https://doi.org/10.3762/bjnano.3.92

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