Ta–Zr–N Thin Films Fabricated through HIPIMS/RFMS Co-Sputtering

Ta–Zr–N thin films were fabricated through co-deposition of radio-frequency magnetron sputtering and high-power impulse magnetron sputtering (HIPIMS/RFMS co-sputtering). The oxidation resistance of the fabricated films was evaluated by annealing the samples in a 15-ppm O2-N2 atmosphere at 600 °C for...

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Bibliographic Details
Main Authors: Li-Chun Chang, Ching-Yen Chang, Ya-Wen You
Format: Article
Language:English
Published: MDPI AG 2017-11-01
Series:Coatings
Subjects:
Online Access:https://www.mdpi.com/2079-6412/7/11/189