Noise Measurements Of Resistors With The Use Of Dual-Phase Virtual Lock-In Technique
Measurement of low-frequency noise properties of modern electronic components is a very demanding challenge due to the low magnitude of a noise signal and the limit of a dissipated power. In such a case, an ac technique with a lock-in amplifier or the use of a low-noise transformer as the first stag...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Polish Academy of Sciences
2015-12-01
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| Series: | Metrology and Measurement Systems |
| Subjects: | |
| Online Access: | http://www.degruyter.com/view/j/mms.2015.22.issue-4/mms-2015-0051/mms-2015-0051.xml?format=INT |