Towards proper sampling and statistical analysis of defects
Advancements in applied statistics with great relevance to defect sampling and analysis are presented. Three main issues are considered; (i) proper handling of multiple defect types, (ii) relating sample data originating from polished inspection surfaces (2D) to finite material volumes (3D), and (i...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
EDP Sciences
2014-06-01
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| Series: | MATEC Web of Conferences |
| Online Access: | http://dx.doi.org/10.1051/matecconf/20141202001 |