Bayesian denoising of white light interference signal in rough surface measurement

The measurement and quantitative analysis of three-dimensional microtopography of failure surface has important values for understanding the initiation and development of failure process. In this paper, we used scanning white-light interferometry (SWLI) for the characterization of metallic failure s...

Full description

Bibliographic Details
Main Authors: Zou Wendong, Zhu Lihua, Wang Weihong, Chen Chungeng
Format: Article
Language:English
Published: EDP Sciences 2016-01-01
Series:MATEC Web of Conferences
Online Access:http://dx.doi.org/10.1051/matecconf/20166101002