Experimental Investigations of State-of-the-Art 650-V Class Power MOSFETs for Cryogenic Power Conversion at 77K

With consideration of both the operating properties from cryogenic MOSFETs and refrigerating costs from cryogenic refrigerators, this paper attempts to carry out the experimental tests and performance evaluations of state-of-the-art 650-V class MOSFETs, and thus to explore a possible design guidelin...

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Bibliographic Details
Main Authors: Yu Chen, Xiao-Yuan Chen, Tao Li, Ying-Jun Feng, Yang Liu, Qin Huang, Meng-Yao Li, Lei Zeng
Format: Article
Language:English
Published: IEEE 2018-01-01
Series:IEEE Journal of the Electron Devices Society
Subjects:
Online Access:https://ieeexplore.ieee.org/document/8063862/