Effects of Interface Trap on Transient Negative Capacitance Effect: Phase Field Model

Ferroelectric materials have received significant attention as next-generation materials for gates in transistors because of their negative differential capacitance. Emerging transistors, such as the negative capacitance field effect transistor (NCFET) and ferroelectric field-effect transistor (FeFE...

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Bibliographic Details
Main Authors: Taegeon Kim, Changhwan Shin
Format: Article
Language:English
Published: MDPI AG 2020-12-01
Series:Electronics
Subjects:
Online Access:https://www.mdpi.com/2079-9292/9/12/2141