Examination of Chaotic Structures in Semiconductor or Alloy Voltage Time-Series: A Complex Network Approach for the Case of TlInTe<sub>2</sub>
This paper proposes a method for examining chaotic structures in semiconductor or alloy voltage oscillation time-series, and focuses on the case of the TlInTe<sub>2</sub> semiconductor. The available voltage time-series are characterized by instabilities in negative differential resistan...
| Main Authors: | , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2020-11-01
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| Series: | Physics |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2624-8174/2/4/36 |