Atomic-scale identification of novel planar defect phases in heteroepitaxial YBa2Cu3O7−δ thin films
We have discovered two novel types of planar defects that appear in heteroepitaxial YBa2Cu3O7−δ (YBCO123) thin films, grown by pulsed-laser deposition (PLD) either with or without a La2/3Ca1/3MnO3 (LCMO) overlayer, using the combination of high-angle annular dark-field scanning transmission electron...
| Main Authors: | , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2018-05-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/1.5011761 |