Reproducing system-level bulk current injection test in direct power injection setup for multiple-port DUTs
Many investigations have been published on the transferability of RF immunity test results between system and IC-levels. The RF signal level at DUT (Device under Test) inputs, i.e. either RF voltage amplitude or RF input current, is used as a reference value for the load on the DUT. Existing approac...
| Main Authors: | , |
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| Format: | Article |
| Language: | deu |
| Published: |
Copernicus Publications
2013-07-01
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| Series: | Advances in Radio Science |
| Online Access: | http://www.adv-radio-sci.net/11/177/2013/ars-11-177-2013.pdf |