Wavelength-Demultiplexed Laser Interferometry for Metrology
Non-contact, cost-efficient, and long-range precision metrology is essential for applications in diverse areas, from 3D sensing and robotics to automated manufacturing, and multiwavelength interferometry is a compelling candidate. Here, we present a new arithmetic approach for multiwavelength phase...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2021-01-01
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| Series: | IEEE Photonics Journal |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9294043/ |