A novel nanoscratch device compatible with commercial microscope for in situ tests of materials’ mechanics

For exploring the mechanical properties and behaviors of new materials, a novel in situ nanoscratch device compatible with commercial microscope has been developed. The developed device with specific dimensions of 178 mm × 165 mm × 78 mm includes the coarse positioning module, the precise feed modul...

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Bibliographic Details
Main Authors: Ning Li, Hongwei Zhao, Peng Zhang, Yue Shi, Yanchao Liu, Mingjun Jin, Hui Wang, Shan Dong
Format: Article
Language:English
Published: SAGE Publishing 2016-04-01
Series:Advances in Mechanical Engineering
Online Access:https://doi.org/10.1177/1687814016646933